Challenge an exact two-gap capacitance fit
For a vacuum parallel-plate source, geometric C = epsilon0 A/d.
Learning outcome: Vary gain and parasitic offset separately, retaining which fit parameter changes. Predict a third-gap indication and explain why it does not resolve common gain. Then calculate the supplied finite-bound area interval and name an additional uncertainty that it omits.
Starting recap
Declare conductor boundaries, integrate potential or charging work, and distinguish controlled charge from voltage.
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Try
For true A = 0.01 m², g = 1.05 and Cp = 20 pF, the indications at 1 and 2 mm are approximately 112.969 and 66.4845 pF. The unit-gain fit returns Afit = 0.0105 m² and Cp = 20 pF. The independent supplied optical area is 0.01 m², revealing a 5% conditional discrepancy.
Open the experimentPredict
Which operation removes an additive stray capacitance but not a common multiplicative gain?
Experiment
Vary gain and parasitic offset separately, retaining which fit parameter changes. Predict a third-gap indication and explain why it does not resolve common gain. Then calculate the supplied finite-bound area interval and name an additional uncertainty that it omits.
Challenge a parasitic-capacitance inference
Worked teaching model · synthetic values · True plate area 0.01 m², vacuum gaps 1 and 2 mm. Indication = gain times geometric capacitance plus additive parasitic term. Fit assumes unit gain and solves area plus offset. Independent optical area stipulated; no real metrology or material identification claim.
Reset keeps your prediction, captures and practice history.
Shared-gain capacitance indications
Axes rescale independently. Curves join sampled coordinates; a joining segment is not additional measured evidence. Read physical units rather than screen angles or apparent slopes.
Shared-gain capacitance indications: numerical coordinates
| gap (mm) | indicated capacitance (pF) |
|---|---|
| 1 | 112.969 |
| 1.05 | 108.542 |
| 1.1 | 104.517 |
| 1.15 | 100.843 |
| 1.2 | 97.4741 |
| 1.25 | 94.3752 |
| 1.3 | 91.5146 |
| 1.35 | 88.8659 |
| 1.4 | 86.4064 |
| 1.45 | 84.1165 |
| 1.5 | 81.9793 |
| 1.55 | 79.98 |
| 1.6 | 78.1056 |
| 1.65 | 76.3448 |
| 1.7 | 74.6876 |
| 1.75 | 73.1251 |
| 1.8 | 71.6494 |
| 1.85 | 70.2535 |
| 1.9 | 68.931 |
| 1.95 | 67.6764 |
| 2 | 66.4845 |
| 2.05 | 65.3507 |
| 2.1 | 64.2709 |
| 2.15 | 63.2414 |
| 2.2 | 62.2586 |
| 2.25 | 61.3195 |
| 2.3 | 60.4213 |
| 2.35 | 59.5613 |
| 2.4 | 58.7371 |
| 2.45 | 57.9465 |
| 2.5 | 57.1876 |
| 2.55 | 56.4584 |
| 2.6 | 55.7573 |
| 2.65 | 55.0826 |
| 2.7 | 54.433 |
| 2.75 | 53.8069 |
| 2.8 | 53.2032 |
| 2.85 | 52.6207 |
| 2.9 | 52.0583 |
| 2.95 | 51.5149 |
| 3 | 50.9897 |
| 3.05 | 50.4816 |
| 3.1 | 49.99 |
| 3.15 | 49.514 |
| 3.2 | 49.0528 |
| 3.25 | 48.6058 |
| 3.3 | 48.1724 |
| 3.35 | 47.7519 |
| 3.4 | 47.3438 |
| 3.45 | 46.9475 |
| 3.5 | 46.5626 |
| 3.55 | 46.1884 |
| 3.6 | 45.8247 |
| 3.65 | 45.471 |
| 3.7 | 45.1267 |
| 3.75 | 44.7917 |
| 3.8 | 44.4655 |
| 3.85 | 44.1478 |
| 3.9 | 43.8382 |
| 3.95 | 43.5364 |
| 4 | 43.2422 |
| Quantity | Value | Unit |
|---|---|---|
| Indication at gap 1 mm | 112.969 | pF |
| Indication at gap 2 mm | 66.4845 | pF |
| Fitted plate area | 0.0105 | m² |
| Fitted additive capacitance | 20 | pF |
| Stipulated independent optical area | 0.01 | m² |
| Relative area inference error | 0.05 | ratio |
| Third-gap indication at 3 mm | 50.9897 | pF |
Two-gap subtraction removes an additive parasitic term but leaves common gain hidden in fitted area.
The known inverse-gap form yields Afit = gain times true area. A third same-instrument gap can still fit the biased area exactly. An independently justified area measurement tests that gain hypothesis only if dielectric composition, plate parallelism and gap calibration are also controlled. This packet does not uniquely identify a real material permittivity.
Derive before checking. Retain contrasting captures and explain one assumption that could fail; calculated evidence is not actual laboratory work.
Two-gap subtraction removes an additive parasitic term but leaves common gain hidden in fitted area.
The known inverse-gap form yields Afit = gain times true area. A third same-instrument gap can still fit the biased area exactly. An independently justified area measurement tests that gain hypothesis only if dielectric composition, plate parallelism and gap calibration are also controlled. This packet does not uniquely identify a real material permittivity.
Captures preserve recipes and replay their calculated results. They are synthetic model evidence, not physical measurements.
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Which conductor boundary, geometric approximation or independent observation could change this conclusion?
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